The Design of a Lumped Element Impedance-Matching Network with Reduced Parasitic Effects Obtained From Numerical Modeling
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Abstract
This paper presents an impedance-matching network design with numerical modeling of the parasitic effects. A modeling tool CEMPIE (a Circuit Extraction approach based on a Mixed Potential Integral Equation formulation) is used to model the hoard-level parasitics of surface mount technology (SMT) resistors for impedance-matching networks. A 3-layer design of impedance-matching network with 0402 SMT resistors is implemented according to the modeling results. And its performance is demonstrated.
This paper has been withdrawn.
