An Expert System Architecture to Detect System-Level Automotive EMC Problems

Sreeniwas Ranganathan
Daryl G. Beetner, Missouri University of Science and Technology
R. Wiese
Todd H. Hubing, Missouri University of Science and Technology

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Improving EMC in automobiles requires methods to detect potential problems early in the design process. Issues involved in the development of a system-level automotive EMC expert system are explored. The proposed system would help identify problems with radiation and immunity, crosstalk, placement of modules, component grounding and EMC testing. The architecture of the expert system has been developed. The system architecture is designed to allow rapid analysis of automobile designs, to point out potential problems and to suggest possible solutions.