Analysis of Chip-Level EMI using Near-Field Magnetic Scanning

Todd H. Hubing, Missouri University of Science and Technology
Daryl G. Beetner, Missouri University of Science and Technology
Shaowei Deng
Xiaopeng Dong

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Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Well designed ICs maintain good control of the currents that they generate. However, poorly designed ICs can drive high-frequency noise currents onto nominally low-frequency input and output pins. These currents can excite unintentional radiating structures on the printed circuit board, resulting in radiated emissions that are difficult or expensive to control. The paper discusses the use of magnetic near-field scanning techniques to measure the current distribution in IC packages. This technique is applied to common ICs, including a clock driver, a memory module and a field programmable gate array (FPGA). Results show that near-field magnetic scanning is an effective tool for investigating chip-level EMI problems.