Microstrip Coupling Algorithm Validation and Modification Based on Measurements and Numerical Modeling

Theodore M. Zeeff
Todd H. Hubing, Missouri University of Science and Technology
James L. Drewniak, Missouri University of Science and Technology
Richard E. DuBroff, Missouri University of Science and Technology
Chris E. Olsen

This document has been relocated to http://scholarsmine.mst.edu/ele_comeng_facwork/1719

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In this study, mutual capacitance and inductance between two coupled traces is measured and computed to validate and simplify coupling algorithms used in an expert system software package. The algorithm's applicability to common microstrip configurations is tested through comparisons between FEM based solutions, S 21 measurements and the algorithm solutions under several permutations of a test board. Adjustments to the original algorithm are proposed that reduce computation times with out significantly affecting the accuracy of the result