BIST Design for CCD Based Digital Imaging System

Bin Jin
Nohpill Park
Serge N. Demidenko
Minsu Choi, Missouri University of Science and Technology
Fabrizio Lombardi

This document has been relocated to http://scholarsmine.mst.edu/ele_comeng_facwork/1471

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Abstract

This paper presents a BIST design for CCD-based digital imaging system. Pixels on a CCD are notfreefrom defective orfaulty pixels due to numerous causes such as imperfectfabrication, excessive exposure to light, radiation, sensing element aging, and excessive mechanical shock, to mention a few. Today's high demandfor high resolution CCDs is dictating defectlfault- tolerance in such devices. Especially, traditional on-device BIST cannot be readily employed on the imaging devices such as CCD due to the unique requirement that no pixel can be utilized to repair or bypass a defect on any other pixels. Therefore, the BIST technique designed and simulated in this paper is a technique to test and repair the defects on pixels off the device, referred to as off-device tolerance. The basic idea was proposed in our previous work in [2] where the off-device defect/fault tolerance was investigated and a soft-testlrepair technique was theoretically proposed in order to demonstrate the efficiency and effectiveness in terms ofreliability, referred to as virtual yield. A Verilog-based design and simulation is provided to demonstrate the validity of the off-device soft-test/repair in terms of reliability (or virtual yield) enhancement and performance.