Radiation Resistance Testing of MOSFET and CMOS as a Means of Risk Management

Akira Tokuhiro, Missouri University of Science and Technology
Massimo F. Bertino, Missouri University of Science and Technology

This document has been relocated to http://scholarsmine.mst.edu/min_nuceng_facwork/1193

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Whether for military, research (space, accelerator physics) and/or civilian use, risk avoidance against radiation-induced damage is not possible with COTS parts. Thus the sensible approach is risk management. We recommend a sensible risk management approach as follows: 1) know the radiation environment of the intended application to the extent possible; 2) know the effects of ionizing radiation on the component(s) of interest; 3) know the requirements of the application; 4) identify the candidate or chosen components; 5) test the components; 6) design-in safety factor margins to the extent possible.