Doubly Differential Cross Sections for Single and Multiple Ionization of Ne by Electron Impact

Antonio C. Santos, Missouri University of Science and Technology
Ahmad Hasan, Missouri University of Science and Technology
Robert D. DuBois, Missouri University of Science and Technology

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We present doubly differential cross sections for single and multiple ionization of the outer shell of neon by 750 eV electron impact. The distinction between single and multiple ionization was achieved by performing a charge state analysis of the recoil ions in coincidence with forward scattered, energy analyzed electrons. By a comparison to photon impact data, the contribution of the second-order double ionization mechanism is estimated and found to be neglible at this impact energy. Following a similar procedure adopted by J. A. R. Samson [Phys. Rev. Lett. 65, 2861 (1990)], the importance of the first-order TS-1 double ionization mechanism is also estimated. As a result it is found that for large energy losses shakeoff is the dominant double ionization mechanism.