Stop That Noise

Todd H. Hubing, Missouri University of Science and Technology
James L. Drewniak, Missouri University of Science and Technology
Thomas Van Doren, Missouri University of Science and Technology
Fei Sha
David M. Hockanson

This document has been relocated to http://scholarsmine.mst.edu/ele_comeng_facwork/1893

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Abstract

The authors discuss electromagnetic compatibility (EMC) and electromagnetic interference (EMI). After a brief look at the causes of EMI, they describe conductive coupling and electromagnetic radiative coupling. Career opportunities in EMC problem solving are looked at.