TID and SEE Testing Results of Altera Cyclone Field Programmable Gate Array

Stephen L. Clark, Missouri University of Science and Technology
K. Avery
R. Parker

This document has been relocated to http://scholarsmine.mst.edu/math_stat_facwork/653

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Total ionizing dose (TID) and single event effects testing was performed on Altera Cyclone FPGAs. The devices exhibit slight performance degradation to a TID of 1 Mrad (Si), but also exhibited single event latchup at a low LET.