Susceptibility Scanning as Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems

Muchaidze Giorgi
Jayong Koo
Qing Cai
Tun Li
Lijun Han
Andrew Martwick
Kai Wang
Jin Min
James L. Drewniak, Missouri University of Science and Technology
David Pommerenke, Missouri University of Science and Technology

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Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.