A Dual-current Method for Characterizing Common-Mode Loop Impedance

Geping Liu
Yimin Ding
Chingchi Chen
R. W. Kautz
James L. Drewniak, Missouri University of Science and Technology
David Pommerenke, Missouri University of Science and Technology
Marina Koledintseva, Missouri University of Science and Technology

This document has been relocated to http://scholarsmine.mst.edu/ele_comeng_facwork/1351

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Abstract

The definition of common-mode loop impedance is proposed instead of the ambiguous definition of common-mode impedance. Moreover, a noninvasive measurement method to characterize the common-mode loop impedance using dual clamp-on current probe is presented herein. The frequency responses of the current probes are deembedded through a calibration procedure. Independent direct measurements using a network analyzer corroborate the validity of the Dual-Current-Probe Method.