Lumped-Element Sections for Modeling Coupling Between High-Speed Digital and I/O Lines

Hao Shi
Xiao Luo
Fei Sha
James L. Drewniak, Missouri University of Science and Technology
T. Anderson
Thomas Van Doren, Missouri University of Science and Technology
Wei Cui

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Lumped-element sections are used for modeling coupling between high-speed digital and I/O lines on printed circuit boards (PCBs) in this paper. Radiated electromagnetic interference (EMI) is investigated when the I/O line going off the board is driven as an unintentional, but effective antenna. Simulated results are compared with measurements for coupled lines. A suitable number of lumped-element sections for modeling is chosen based on the line length and the highest frequency of interest.