Field Extraction from Near Field Scanning for a Microstrip Structure

Lin Zhang
Chen Wang
Masahiro Yamaguchi
K.-I. Arai
Richard E. DuBroff, Missouri University of Science and Technology
David Pommerenke, Missouri University of Science and Technology
Todd H. Hubing, Missouri University of Science and Technology
Kevin P. Slattery
James L. Drewniak, Missouri University of Science and Technology

This document has been relocated to http://scholarsmine.mst.edu/ele_comeng_facwork/1050

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Abstract

Currents associated with high-speed digital devices have significant impacts on EMI problems in VLSI design and operation. In this paper, a simple transmission line model was implemented as an initial step to represent the EMI mechanisms associated with an IC package. Numerical modeling results were compared with near field scanning measurements and show that the magnetic field deduced from the measurements agrees well with the numerical predictions.