Dielectric Material Characterization by Complex Ratio of Embedded Modulated Scatterer Technique States
This document has been relocated to http://scholarsmine.mst.edu/ele_comeng_facwork/1544
There were 6 downloads as of 28 Jun 2016.
Abstract
The embedded modulated seatterer technique (MST) is an innovative tool which can be used for microwave dielectric characterization of infrastructure and composite structures. By impinging a microwave signal on a loaded thin dipole antenna embedded in a material whose dielectric properties are sought, the resulting refelction data can be used to inversely solve for the dielectric properties of interest. Previous investigations utilized reflection information from a single loaded dipole and required known system parameters, such as radiator polarization vs. dipole alignment and relative distance between radiator and probe, to solve for the sought-for dielectric properties. This paper explores a unique application of embedded MST in which the ratio of the reflection coefficients for two independent states of a PIN diode-loaded dipole probe is utilized to significantly simplify the method for calculating dielectric properties.
