Detection of Electronic Mines, Timers, and Fuses Through Electromagnetic Interference Signatures and Stimulated Emissions
Electromagnetic emissions from electronics associated with explosives - mines, timers, and fuses - have been experimentally observed. The emissions fall into two categories, those resulting from the natural functioning of the electronics themselves - an electromagnetic interference (EMI) signature, and stimulated emissions resulting from RF irradiation of the electronics and re-radiation by the circuit. In order to develop suitable detection modalities for these processes, an understanding of the basic physics of the radiation process is essential. The basic physics of radiation and stimulation of electronic circuits are being studied, and electromagnetic interference characterization and measurement procedures are being developed. Finite-difference time-domain modeling is being applied to gain insight into radiation processes and levels so that the feasibility of detection of these signatures can be evaluated, and detection systems developed.
X. Ye et al., "Detection of Electronic Mines, Timers, and Fuses Through Electromagnetic Interference Signatures and Stimulated Emissions," Proceedings of Detection and Remediation Technologies for Mines and Minelike Targets V (2000, Orlando, FL), vol. 4038, pp. 66-77, SPIE -- The International Society for Optical Engineering, Jun 2000.
The definitive version is available at https://doi.org/10.1117/12.396174
Detection and Remediation Technologies for Mines and Minelike Targets V (2000: Apr. 24-28, Orlando, FL)
Electrical and Computer Engineering
Keywords and Phrases
Bombs (Ordnance); Electromagnetic Wave Interference; Finite Difference Method; Mathematical Models; Radar Measurement; Stimulated Emission; Time Domain Analysis; Timing Circuits; Electronic Fuse; Electronic Mines; Electronic Timers; Radio Frequency Irradiation; Radar Target Recognition; Electronics; Explosives
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2000 SPIE -- The International Society for Optical Engineering, All rights reserved.
01 Jun 2000