Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.
G. Muchaidze et al., "Automated Near-Field Scanning to Identify Resonances," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility: EMC Europe (2008, Hamburg, Germany), Institute of Electrical and Electronics Engineers (IEEE), Sep 2008.
The definitive version is available at https://doi.org/10.1109/EMCEUROPE.2008.4786897
IEEE International Symposium on Electromagnetic Compatibility (2008: Sep. 8-12, Hamburg, Germany)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Resonance; Electromagnetic Interference; Immunity Testing; Coupling Circuits; Electromagnetic Compatibility; Electrostatic Discharge; Integrated Circuit Noise; Clocks; Cables; Frequency; EMI; Near Field Scanning; ESD; Data Exchanges; Electronic Systems; File Formats; Immunity Analysis; Near Field Scanning; Near Fields; Standardized Methods; System Analysis; Electric Inverters; Electromagnetic Pulse; Electrostatic Devices; Plastic Molds; Resonance; Scanning
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Article - Conference proceedings
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Sep 2008