Modelling Attacks and Challenges to Wireless Networks
Due to the tremendous potential of MANETs (mobile ad hoc networks) for deployment in commercial and military services, a thorough understanding of network behaviour when exposed to challenges is essential for constructing a resilient and survivable MANET. Therefore, it is vital to have a comprehensive framework that can model it under various network attacks and challenges. The MANET environment has a dynamic and intermittent connectivity resulting from channel fading and mobility of the nodes, which makes it difficult to model the network as well as its challenges. We provide a model to simulate malicious and area-based challenges to wireless networks. In the modelling of malicious attacks, we treat MANETs as time-varying graphs (TVGs) represented as a weighted adjacency matrix, in which the weights refer to the link availability. We evaluate the relations between node significance and weighted centrality metrics. Area-based challenges representative of real-world scenarios are also modelled. Our ultimate goal is to provide a comprehensive network challenge model of MANETs and also heterogeneous networks.
D. Zhang et al., "Modelling Attacks and Challenges to Wireless Networks," Proceedings of the 4th International Congress on Ultra Modern Telecommunications and Control Systems (ICUMT), pp. 806-812, Institute of Electrical and Electronics Engineers (IEEE), Jan 2012.
The definitive version is available at https://doi.org/10.1109/ICUMT.2012.6459774
4th International Congress on Ultra Modern Telecommunications and Control Systems (ICUMT) (2012: Oct. 3-5, St Petersburg, Russia)
Electrical and Computer Engineering
Keywords and Phrases
Disruption Tolerant Networks; MANET; Mobile Wireless; Ns-3 Simulations; Weighted Graph; Computer Crime; Control Systems; Fading Channels; Heterogeneous Networks; Telecommunication Networks; Topology; Wireless Networks; Mobile Ad Hoc Networks
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Electronic OCLC #
Article - Conference proceedings
© 2012 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jan 2012