L. Zhang et al., "A Solution for EAF Induced Problems in Bulk Power Systems by FACT/ESS," Proceedings of the IEEE Power Engineering Society General Meeting (2005, San Francisco, CA), pp. 1831-1838, Institute of Electrical and Electronics Engineers (IEEE), Jun 2005.
The definitive version is available at https://doi.org/10.1109/PES.2005.1489445
IEEE Power Engineering Society General Meeting (2005: Jun. 12-16, San Francisco, CA)
Electrical and Computer Engineering
International Standard Book Number (ISBN)
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Article - Conference proceedings
© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jun 2005