The use of combined embedded modulated scattering technique and near-field microwave nondestructive testing techniques is investigated as a novel method for evaluating the dielectric properties of a material. The forward formulation for determining the reflection coefficient at the aperture of a waveguide radiating into a dielectric half-space in which a PIN diode-loaded dipole (i.e., modulated scattering technique probe) is embedded is presented. This formulation is based upon calculating the near-field coupling between the waveguide and the dipole as a mutual impedance.
D. M. Hughes and R. Zoughi, "A Novel Method for Determination of Dielectric Properties of Materials using a Combined Embedded Modulated Scattering and Near-Field Microwave Techniques-Part I: Forward Model," IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 6, pp. 2389-2397, Institute of Electrical and Electronics Engineers (IEEE), Dec 2005.
The definitive version is available at https://doi.org/10.1109/TIM.2005.858132
Electrical and Computer Engineering
Keywords and Phrases
Dielectric Material Characterization; PIN Diode-Loaded Dipole; Dielectric Half-Space; Dielectric Material Property; Dielectric Materials; Dielectric Measurement; Dielectric Properties; Electromagnetic Wave Reflection; Electromagnetic Wave Scattering; Embedded Modulated Scattering; Embedded Sensors; Forward Formulation; Microwave Measurement; Microwave Nondestructive Testing; Modulated Scattering Technique; Modulated Scattering Technique Probe; Near-Field Coupling; Near-Field Microwave Nondestructive Testing; Nondestructive Testing; Reflection Coefficient; Waveguide Aperture; Electromagnetic Formulation-Probe Development and Antennas; Material Characterization
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© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Dec 2005