Abstract
This work proposes a Built-in Self Test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.
Recommended Citation
M. V. Joshi and W. K. Al-Assadi, "A BIST Approach for Configurable Nanofabric Arrays," Proceedings of the 8th IEEE Conference on Nanotechnology, 2008. NANO'08, Institute of Electrical and Electronics Engineers (IEEE), Aug 2008.
The definitive version is available at https://doi.org/10.1109/NANO.2008.210
Meeting Name
8th IEEE Conference on Nanotechnology, 2008. NANO'08
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
BIST; Crossbar Architecture; Defects; Nanofabrics; Recovery; Redundancy; Nanowires
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2008
