Abstract
A physics-based circuit modeling methodology for system-level power integrity (PI) analysis and design is presented herein. The modeling methodology is based on representing the current paths in the power distribution network (PDN) with appropriate circuits based on cavity model and plane-pair partial element equivalent circuit (PEEC). The PDN input impedance looking from on-chip sources can be computed. A commercial simulation tool is used to corroborate the modeling approach where the system consists of a commercial integrated circuit, a complex organic package and a very high-layer-count printed circuit board. Two types of circuit models are proposed from the methodology with physical correspondence maintained in the circuit elements. The circuits can be used to analyze the geometry impact on the PDN impedance and explore design improvements. Voltage ripple simulations are conducted with the circuit models. The simulated results correlated with measurements. The modeling methodology helps to understand the impact of the fundamental physics of the different parts of the PDN system and the impact of changes in the PI designs.
Recommended Citation
B. Zhao et al., "Physics-Based Circuit Modeling Methodology for System Power Integrity Analysis and Design," IEEE Transactions on Electromagnetic Compatibility, vol. 62, no. 4, pp. 1266 - 1277, article no. 8770129, Institute of Electrical and Electronics Engineers, Aug 2020.
The definitive version is available at https://doi.org/10.1109/TEMC.2019.2927742
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Cavity model; input impedance; plane pair partial element equivalent circuit (PPP); power distribution network (PDN) design; power integrity (PI); system PDN; voltage ripple
International Standard Serial Number (ISSN)
1558-187X; 0018-9375
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Aug 2020
Comments
National Science Foundation, Grant IIP-1440110