Abstract

A method to model, measure, and characterize a high-transient current in an electrical packaging solution is described herein. These methods help overcome the challenge of generating model to hardware correlation in high current applications. A specialized test platform is developed and used to characterize current density in test hardware. The measurements are used to characterize a custom power distribution network and verify validity of current density predictions. This data is critical in high-current applications for finding and measuring current density through plane pinch points that can cause early failures in the field due to electromigration and delamination.

Department(s)

Electrical and Computer Engineering

Comments

Mayo Clinic, Grant None

International Standard Book Number (ISBN)

978-073814523-5

International Standard Serial Number (ISSN)

0569-5503

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

01 Jan 2021

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