Emission Source Microscopy (ESM) Could Be Utilized to Localize the Electromagnetic Interference (EMI) Sources that Contribute to the Far-Field Radiation. in Those Cases, the Electrical Field over a Two-Dimensional Plane is Collected by Mechanical Scanning, Resulting in a Long Measurement Time and the Presence of Mechanical Errors. in This Work, a Microwave Camera based on a Two-Dimensional Array of Elliptical Slot Antennas and Diode Detectors is Presented. Multiplexers Are Utilized to Access the Output of Each Detector and the Scanning of the Whole Array Could Be Done Multiple Times Per Second.
X. Yan et al., "A Real-Time Microwave Camera Prototype with Zero-Bias Diode Detectors for EMI Source Imaging," 2023 IEEE Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMC+SIPI 2023, pp. 614 - 618, Institute of Electrical and Electronics Engineers, Jan 2023.
The definitive version is available at https://doi.org/10.1109/EMCSIPI50001.2023.10241444
Electrical and Computer Engineering
Keywords and Phrases
diode detector; Emission source microscopy; microwave camera
Article - Conference proceedings
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01 Jan 2023