Improvement on the Accuracy of Near-Field Scanning using Tangential Electric Field Probe
This paper discussed the issues about the nearfield measurement with a differential electric (E) probe. Based on the physical understanding, a method to improve the accuracy of the measured E field is proposed by suppressing the common-mode noise and eliminating the unwanted magnetic (H) field coupling. By adding ferrites around the cables that connect to the differential E field probe, suppression of the commonmode (CM) noise in the outer shield of the probe is achieved. In addition, the probe factor for the unwanted H field coupling of the E field probe is calibrated, which can be used to eliminate the H field coupling during the E field measurement. The effectiveness of the proposed method has been demonstrated in experiments. This paper provides a practical method to obtain accurate E-field measurement with a tangential E field probe, especially in the cases where the detected signal of the unwanted coupling is comparable to the wanted coupling.
W. Zhang et al., "Improvement on the Accuracy of Near-Field Scanning using Tangential Electric Field Probe," Proceedings of the 2021 Joint IEEE International Symposium on EMC/SI/PI, and EMC Europe (2021, Raleigh, NC), pp. 370 - 375, Institute of Electrical and Electronics Engineers (IEEE), Aug 2021.
The definitive version is available at https://doi.org/10.1109/EMC/SI/PI/EMCEurope52599.2021.9559226
2021 IEEE International Joint Electromagnetic Compatibility Signal and Power Integrity and EMC Europe Symposium, EMC/SI/PI/EMC Europe 2021 (2021: Jul. 26-Aug. 13, Raleigh, NC)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
CM Noise; E Near-Field Probe; H Field Coupling; Near-Field Scanning; Radio Frequency Interference (RFI)
International Standard Book Number (ISBN)
Article - Conference proceedings
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13 Aug 2021