Title

Improvement on the Accuracy of Near-Field Scanning using Tangential Electric Field Probe

Abstract

This paper discussed the issues about the nearfield measurement with a differential electric (E) probe. Based on the physical understanding, a method to improve the accuracy of the measured E field is proposed by suppressing the common-mode noise and eliminating the unwanted magnetic (H) field coupling. By adding ferrites around the cables that connect to the differential E field probe, suppression of the commonmode (CM) noise in the outer shield of the probe is achieved. In addition, the probe factor for the unwanted H field coupling of the E field probe is calibrated, which can be used to eliminate the H field coupling during the E field measurement. The effectiveness of the proposed method has been demonstrated in experiments. This paper provides a practical method to obtain accurate E-field measurement with a tangential E field probe, especially in the cases where the detected signal of the unwanted coupling is comparable to the wanted coupling.

Meeting Name

2021 IEEE International Joint Electromagnetic Compatibility Signal and Power Integrity and EMC Europe Symposium, EMC/SI/PI/EMC Europe 2021 (2021: Jul. 26-Aug. 13, Raleigh, NC)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Comments

This work was supported in part by the National Science Foundation (NSF) under Grant IIP-1916535.

Keywords and Phrases

CM Noise; E Near-Field Probe; H Field Coupling; Near-Field Scanning; Radio Frequency Interference (RFI)

International Standard Book Number (ISBN)

978-166544888-8

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2021 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

13 Aug 2021

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