A New Current Probe for Measuring Transient Events under Data Traffic
Using inductive current measurement technique, a new current probe is proposed that allows transient current measurement on data traces without disturbing the normal operation or transfer rate of the trace under test. The proposed probe layout, circuit model, and frequency response is discussed in detail.
O. H. Izadi et al., "A New Current Probe for Measuring Transient Events under Data Traffic," Proceedings of the 42nd Annual Electrical Overstress/Electrostatic Discharge Symposium (2020, Reno, NV), pp. 1-8, Institute of Electrical and Electronics Engineers (IEEE), Nov 2020.
42nd Annual EOS/ESD Symposium (2020: Sep. 13-18, Reno, NV)
Electrical and Computer Engineering
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Article - Conference proceedings
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10 Nov 2020