Title

A New Current Probe for Measuring Transient Events under Data Traffic

Abstract

Using inductive current measurement technique, a new current probe is proposed that allows transient current measurement on data traces without disturbing the normal operation or transfer rate of the trace under test. The proposed probe layout, circuit model, and frequency response is discussed in detail.

Meeting Name

42nd Annual EOS/ESD Symposium (2020: Sep. 13-18, Reno, NV)

Department(s)

Electrical and Computer Engineering

Comments

National Science Foundation, Grant IIP-1916535

International Standard Book Number (ISBN)

978-172819461-5

International Standard Serial Number (ISSN)

0739-5159

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2020 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

10 Nov 2020

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