Title

Photocharge-Modulated Passive Intermodulation on Ag₂O/Ag Junction in High-Power Microwave Devices

Abstract

This letter studies the photocharge-modulated passive intermodulation (PIM) effect on the Ag2O/Ag contact junction. It is demonstrated that the photocharge with the parasitic parameters on the contact junction can modulate the electron transport process and make the PIM components changed with photoillumination. The linear RC constant can change the nonlinear current strength, under the periodical photostimulation, and PIM components will vary with the photopulses. In the experiment, by using a specially designed coaxial fixture to measure the PIM response with RC components on the contact junction, a semianalytical model for this photoeffect-modulated contact PIM is demonstrated.

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Comments

This work was supported in part by the National Science Foundation for Young Scientists of China under Grant 61901296, in part by the China Postdoctoral Science Special Foundation under Grant 2019TQ0224, and in part by the China Postdoctoral Science General Foundation under Grant 2019M661018.

Keywords and Phrases

Contact Nonlinearity; Passive Intermodulation (PIM); Photocharge Modulation; Silver Oxide

International Standard Serial Number (ISSN)

1531-1309

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2020 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Mar 2020

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