Scanning of Random Fields using Blind Source Separation
Abstract
A method for the measurement of the field generated by multiple non-correlated sources is proposed. The contribution of each source is determined using a blind source separation (BSS) technique. The measurements are performed using one scanning probe and stationary reference probes, avoiding the need to measure the spatial correlations of the random field. The resolving result can be used to localize the emission sources and their contribution to the far-field pattern. The method was tested on different signals with amplitude and frequency modulation.
Recommended Citation
Y. Liu et al., "Scanning of Random Fields using Blind Source Separation," Proceedings of the 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity (2019, New Orleans, LA), pp. 235 - 240, Institute of Electrical and Electronics Engineers (IEEE), Jul 2019.
The definitive version is available at https://doi.org/10.1109/ISEMC.2019.8825273
Meeting Name
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2019 (2019: Jul. 22-26, New Orleans, LA)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Blind Source Separation; Electromagnetic Interference; Modulated Signals; Near Field Scan; Phase Resolving; Random Fields
International Standard Book Number (ISBN)
978-153869199-1
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2019
