Title

Scanning of Random Fields using Blind Source Separation

Abstract

A method for the measurement of the field generated by multiple non-correlated sources is proposed. The contribution of each source is determined using a blind source separation (BSS) technique. The measurements are performed using one scanning probe and stationary reference probes, avoiding the need to measure the spatial correlations of the random field. The resolving result can be used to localize the emission sources and their contribution to the far-field pattern. The method was tested on different signals with amplitude and frequency modulation.

Meeting Name

2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2019 (2019: Jul. 22-26, New Orleans, LA)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Blind Source Separation; Electromagnetic Interference; Modulated Signals; Near Field Scan; Phase Resolving; Random Fields

International Standard Book Number (ISBN)

978-153869199-1

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Jul 2019

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