Multi-Ports (2ⁿ) 2x-Thru De-Embedding: Theory, Validation, and Mode Conversion Characterization
Because of the simplicity of design and measurement, as well as the accuracy of results, the 2x-thru de-embedding has replaced the traditional de-embedding algorithms such as thru-reflect-line and short-open-load-thru for printed circuit board (PCB) characterization. In this paper, the theory of [2n-port 2x-Thru de-embedding is derived first. The self-error reduction schemes are introduced to mitigate the de-embedding errors due to non-ideal manufacturing effects that make mode conversion terms non-zero. Both the theory and the self-error reduction schemes are fully validated through simulation and measurement cases.
B. Chen et al., "Multi-Ports (2ⁿ) 2x-Thru De-Embedding: Theory, Validation, and Mode Conversion Characterization," IEEE Transactions on Electromagnetic Compatibility, vol. 61, no. 4, pp. 1261-1270, Institute of Electrical and Electronics Engineers (IEEE), Aug 2019.
The definitive version is available at https://doi.org/10.1109/TEMC.2019.2908782
Electrical and Computer Engineering
Keywords and Phrases
2n-Port 2x-Thru De-Embedding; De-Embedding; Far-End Crosstalk (FEXT); Manufacturing Variations; Mixed-Mode; Near-End Crosstalk (NEXT); Self-Error Reduction; Test Fixtures
International Standard Serial Number (ISSN)
Article - Journal
© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2019