Title

Multi-Ports (2ⁿ) 2x-Thru De-Embedding: Theory, Validation, and Mode Conversion Characterization

Abstract

Because of the simplicity of design and measurement, as well as the accuracy of results, the 2x-thru de-embedding has replaced the traditional de-embedding algorithms such as thru-reflect-line and short-open-load-thru for printed circuit board (PCB) characterization. In this paper, the theory of [2n-port 2x-Thru de-embedding is derived first. The self-error reduction schemes are introduced to mitigate the de-embedding errors due to non-ideal manufacturing effects that make mode conversion terms non-zero. Both the theory and the self-error reduction schemes are fully validated through simulation and measurement cases.

Department(s)

Electrical and Computer Engineering

Comments

This work was supported in part by the National Science Foundation under Grant IIP-1440110.

Keywords and Phrases

2n-Port 2x-Thru De-Embedding; De-Embedding; Far-End Crosstalk (FEXT); Manufacturing Variations; Mixed-Mode; Near-End Crosstalk (NEXT); Self-Error Reduction; Test Fixtures

International Standard Serial Number (ISSN)

0018-9375

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Aug 2019

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