Title

Signal-Signal D-Probe and Unified Launch Pad Designs

Abstract

In this paper, two different micro probes (D-probe and GSSG probe) are studied. A specially designed PCB was used to compare the electrical performances of DUTs with de-embedded fixtures for the micro probes and 2.9 mm connectors. Smart Fixture De-embedding (SFD) was used to de-embed the S-parameters of the DUT from the test fixtures. The results showed consistent results of DUTs using both micro probes and 2.92 mm connectors up to nearly 40GHz.

Department(s)

Electrical and Computer Engineering

Comments

This material is based upon work supported partially by the National Science Foundation under Grant No. IIP-1440110.

Keywords and Phrases

Design for testability; Fixtures (tooling); Organic pollutants; Polychlorinated biphenyls; Scattering parameters; De-embedding; Electrical performance; Launch pads; Micro-probes; Test fixture; Probes; 2.9 mm connector; Differential micro probe; PCB; SFD

International Standard Serial Number (ISSN)

2162-2264

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Oct 2018

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