Signal-Signal D-Probe and Unified Launch Pad Designs
In this paper, two different micro probes (D-probe and GSSG probe) are studied. A specially designed PCB was used to compare the electrical performances of DUTs with de-embedded fixtures for the micro probes and 2.9 mm connectors. Smart Fixture De-embedding (SFD) was used to de-embed the S-parameters of the DUT from the test fixtures. The results showed consistent results of DUTs using both micro probes and 2.92 mm connectors up to nearly 40GHz.
Y. Chen et al., "Signal-Signal D-Probe and Unified Launch Pad Designs," IEEE Electromagnetic Compatibility Magazine, vol. 7, no. 3, pp. 101-106, Institute of Electrical and Electronics Engineers (IEEE), Oct 2018.
The definitive version is available at https://doi.org/10.1109/MEMC.2018.8479348
Electrical and Computer Engineering
Keywords and Phrases
Design for testability; Fixtures (tooling); Organic pollutants; Polychlorinated biphenyls; Scattering parameters; De-embedding; Electrical performance; Launch pads; Micro-probes; Test fixture; Probes; 2.9 mm connector; Differential micro probe; PCB; SFD
International Standard Serial Number (ISSN)
Article - Journal
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Oct 2018