A 20 GHz Landing Probe Design based on Pogo-Pins
Abstract
A landing probe design is proposed in this paper based on pogo-pins. Landing probes are usually used to obtain TDR and S-parameters of the device under test (DUT) so that the performance of the DUT can be evaluated. This design has two major advantages. First, it is durable. Second, it can be easily integrated into automated testing systems. The designed probe works well up to 20 GHz, which is validated by measurement.
Recommended Citation
X. Yan et al., "A 20 GHz Landing Probe Design based on Pogo-Pins," Proceedings of the 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (2018, Long Beach, CA), pp. 57 - 61, Institute of Electrical and Electronics Engineers (IEEE), Jul 2018.
The definitive version is available at https://doi.org/10.1109/EMCSI.2018.8495397
Meeting Name
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 (2018: Jul. 30-Aug. 3, Long Beach, CA)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Busbars; Electromagnetic compatibility; Landing; Probes; Scattering parameters; Automated testing; Device under test; Landing pads; Pogo-pin; Probe design; Signal Integrity (SI); Design for testability
International Standard Book Number (ISBN)
978-1-5386-6621-0
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2018
Comments
This paper is based upon work supported by the National Science Foundation under Grant No. IIP-1440110.