Title

A 20 GHz Landing Probe Design based on Pogo-Pins

Abstract

A landing probe design is proposed in this paper based on pogo-pins. Landing probes are usually used to obtain TDR and S-parameters of the device under test (DUT) so that the performance of the DUT can be evaluated. This design has two major advantages. First, it is durable. Second, it can be easily integrated into automated testing systems. The designed probe works well up to 20 GHz, which is validated by measurement.

Meeting Name

2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 (2018: Jul. 30-Aug. 3, Long Beach, CA)

Department(s)

Electrical and Computer Engineering

Comments

This paper is based upon work supported by the National Science Foundation under Grant No. IIP-1440110.

Keywords and Phrases

Busbars; Electromagnetic compatibility; Landing; Probes; Scattering parameters; Automated testing; Device under test; Landing pads; Pogo-pin; Probe design; Signal Integrity (SI); Design for testability

International Standard Book Number (ISBN)

978-1-5386-6621-0

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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