Embedded chipless RFID measurement methodology for microwave materials characterization
The use of chipless RFID is rapidly growing with applications for both identification and sensing purposes. In existing chipless RFID technology for identification purposes, radar cross-section (RCS) vs. frequency information is often used to create a unique identification (binary) code of 1's and 0's. In contrast, for purposes such as environmental sensing (i.e., temperature, humidity, gas concentration, etc.), a shift in the RCS frequency response is then correlated to the sought-for information. In this paper the utility of embedding chipless RFID sensors in various dielectric materials is investigated, where changes in the material properties cause a shift in the RFID frequency response and the changes are translated to a change in its original binary code. To illustrate the efficacy of this unique technique for materials characterization, electromagnetic simulations and measurements were conducted, the result of which are presented in this paper.
K. Brinker and R. Zoughi, "Embedded chipless RFID measurement methodology for microwave materials characterization," Proceedings of the 2018 IEEE International Instrumentation and Measurement Technology Conference (2018, Houston, TX), Institute of Electrical and Electronics Engineers (IEEE), May 2018.
The definitive version is available at https://doi.org/10.1109/I2MTC.2018.8409670
2018 IEEE International Instrumentation and Measurement Technology Conference: Discovering New Horizons in Instrumentation and Measurement, I2MTC (2018: May 14-17, Houston, TX)
Electrical and Computer Engineering
Keywords and Phrases
Chipless RFID; Embedded Sensors; Material Characterization; Microwaves
International Standard Book Number (ISBN)
Article - Conference proceedings
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 May 2018