Reliability Assesment of Power System at the Presence of Demand Side Management
Demand response (DR) is a key component of smart grids that can bring a lot of benefits to power system operators and customers. Most literature on DR focuses on the operation, control and planning aspects of "smart grids", while its impact on, and potential for improving system reliability is less studied. DR can mitigate the operational limit violations by changing the load profile when the reliability of the system is jeopardized. This work assesses potential impacts of demand response on the loss of load probability (LOLP: expected number of days per period on which capacity is insufficient), which is a widely used metric of power system reliability. We considered detailed and practical models of individual residential loads for flexible loads. The flexible load models used in this work are various household appliances with different acceptable delay times (ADTs) within which their consumption can be shifted from the normal schedules. The obtained results show that the DSM can decrease the LOLP.
M. R. Narimani et al., "Reliability Assesment of Power System at the Presence of Demand Side Management," Proceedings of the 2016 IEEE Power and Energy Conference at Illinois (2016, Urbana, IL), Institute of Electrical and Electronics Engineers (IEEE), Feb 2016.
The definitive version is available at https://doi.org/10.1109/PECI.2016.7459222
2016 IEEE Power and Energy Conference at Illinois, PECI (2016, Feb. 19-20, Urbana, IL)
Electrical and Computer Engineering
Keywords and Phrases
Demand side management; Domestic appliances; Electric load loss; Electric power transmission networks; Electric utilities; Reliability; Smart power grids; Delay Time; Improving systems; Operational limits; Planning aspects; Potential impacts; Power system operators; Power system reliability; Residential loads; Loss of load probability; Acceptable delay time
International Standard Book Number (ISBN)
Article - Conference proceedings
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Feb 2016