A BIST Technique for Configurable Nanofabric Arrays
This work proposes a built-in self test (BIST) approach to test crossbars for a defined set of faults. The BIST can classify the different programmable elements in the crossbars as non-defective or defective with a certain fault type. The logic synthesis can then configure the crossbar by avoiding these defective elements.
W. K. Al-Assadi et al., "A BIST Technique for Configurable Nanofabric Arrays," International Workshop on Design and Test of Nano Devices, Circuits and Systems, Institute of Electrical and Electronics Engineers (IEEE), Sep 2008.
The definitive version is available at https://doi.org/10.1109/NDCS.2008.8
Electrical and Computer Engineering
Keywords and Phrases
Built-In Self Test; Logic Testing; Nanoelectronics; Programmable Circuits
Article - Conference proceedings
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Sep 2008