Identifying Techniques, Topologies and Features for Maximizing the Efficiency of a Distribution Grid with Solid State Power Devices

Abstract

The FREEDM grid utilizes solid state transformers (SST) and solid state fault interruption devices (FID) which may lead to unfavorable operating losses as compared to a conventional grid. Various SST topologies and switching techniques are identified for minimizing losses and a performance evaluation is made to determine the efficiency of the FREEDM distribution network to improve the overall efficiency. Losses include conductors, SSTs, FIDs, and conventional distribution transformers tested under various loading levels. Compared to a conventional distribution network, the FREEDM grid has a slight reduction in losses. By choosing the proper distribution line configuration, conductor type, switching devices and switching techniques, the power losses on the system may be minimized further.

Meeting Name

North American Power Symposium (2010: Sep. 26-28, Arlington, TX)

Department(s)

Electrical and Computer Engineering

Sponsor(s)

National Science Foundation (U.S.). Engineering Research Centers Program

Comments

This work was supported by the ERC Program of the National Science Foundation under Award Number EEC-08212121.

Keywords and Phrases

Distribution Grid; Distribution Lines; Distribution Network; Distribution Transformer; FREEDM; Loading Level; Microgrid; Operating Loss; Overall Efficiency; Performance Evaluation; Power-Losses; Renewable Energies; Solid-State Power Devices; State-Transformers; Switching Devices; Switching Techniques; Distributed Parameter Networks; Optimization; Renewable Energy Resources; Topology; Solid State Devices; Renewable Energy; Solid State Fault Interruption Device; Solid State Transformer

International Standard Book Number (ISBN)

978-1424480463; 978-1424480470

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2010 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Sep 2010

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