Identifying Techniques, Topologies and Features for Maximizing the Efficiency of a Distribution Grid with Solid State Power Devices
The FREEDM grid utilizes solid state transformers (SST) and solid state fault interruption devices (FID) which may lead to unfavorable operating losses as compared to a conventional grid. Various SST topologies and switching techniques are identified for minimizing losses and a performance evaluation is made to determine the efficiency of the FREEDM distribution network to improve the overall efficiency. Losses include conductors, SSTs, FIDs, and conventional distribution transformers tested under various loading levels. Compared to a conventional distribution network, the FREEDM grid has a slight reduction in losses. By choosing the proper distribution line configuration, conductor type, switching devices and switching techniques, the power losses on the system may be minimized further.
K. Stefanski et al., "Identifying Techniques, Topologies and Features for Maximizing the Efficiency of a Distribution Grid with Solid State Power Devices," Proceedings of the North American Power Symposium (2010, Arlington, TX), Institute of Electrical and Electronics Engineers (IEEE), Sep 2010.
The definitive version is available at https://doi.org/10.1109/NAPS.2010.5618966
North American Power Symposium (2010: Sep. 26-28, Arlington, TX)
Electrical and Computer Engineering
National Science Foundation (U.S.). Engineering Research Centers Program
Keywords and Phrases
Distribution Grid; Distribution Lines; Distribution Network; Distribution Transformer; FREEDM; Loading Level; Microgrid; Operating Loss; Overall Efficiency; Performance Evaluation; Power-Losses; Renewable Energies; Solid-State Power Devices; State-Transformers; Switching Devices; Switching Techniques; Distributed Parameter Networks; Optimization; Renewable Energy Resources; Topology; Solid State Devices; Renewable Energy; Solid State Fault Interruption Device; Solid State Transformer
International Standard Book Number (ISBN)
Article - Conference proceedings
© 2010 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Sep 2010