Using a Single-Ended TRL Calibration Pattern to De-Embed Coupled Transmission Lines
Transmission line port de-embedding is critical in characterization and modeling for high-speed digital systems. De-embedding technique for single-ended transmission lines has been developed and widely used. However, few de-embedding techniques for coupled transmission lines have been reported in the literature. In this paper, a de-embedding technique for coupled transmission lines using a single-ended TRL (Thru-Reflect-Line) calibration pattern is proposed. It is based on directly obtaining VNA (Vector Network Analyzer) error correction data from measurement and post data processing. As accurate de-embedding is related to the equipments used in the measurement, the proposed technique is verified on two different VNAs with different architectures including a three-sampler VNA and a four-sampler VNA. Good agreement of de-embedded mixed-mode S-parameters has been achieved on both VNAs.
J. Zhang et al., "Using a Single-Ended TRL Calibration Pattern to De-Embed Coupled Transmission Lines," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2009, Austin, TX), pp. 197 - 202, Institute of Electrical and Electronics Engineers (IEEE), Aug 2009.
The definitive version is available at https://doi.org/10.1109/ISEMC.2009.5284624
IEEE International Symposium on Electromagnetic Compatibility (2009: Aug. 17-21, Austin, TX)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Calibration Patterns; Coupled Transmission Line; De-Embedding; De-Embedding Techniques; High-Speed Digital Systems; Mixed-Mode S-Parameters; Single-Ended; Thru Reflect Lines; Transmission Line; TRL Calibration; Vector Network Analyzers; Bandpass Filters; Calibration; Data Processing; Electric Lines; Electric Network Analysis; Electromagnetic Compatibility; Error Correction; Plastic Molds; Scattering Parameters; Transmission Line Theory, Electric Network Analyzers
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Article - Conference proceedings
© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2009