Stressed Jitter Analysis for Physical Link Characterization
A link-path analysis approach is introduced in this paper based on the frequency-domain S-parameters of the link path. Different jitter components are also modelled and can be injected into the analysis to characterize the link responses to different types of jitter input. Stressed link path analysis can be very useful in practical engineering designs in terms of link path optimization, device selection and qualification, etc.
N. Radhakrishnan et al., "Stressed Jitter Analysis for Physical Link Characterization," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2010, Fort Lauderdale, FL), pp. 568 - 572, Institute of Electrical and Electronics Engineers (IEEE), Jul 2010.
The definitive version is available at https://doi.org/10.1109/ISEMC.2010.5711339
IEEE International Symposium on Electromagnetic Compatibility (2010: Jul. 25-30, Fort Lauderdale, FL)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Device Selection; Frequency Domains; Jitter Analysis; Path Analysis; Path Optimizations; Practical Engineering; S-Parameters; Electromagnetic Compatibility; Electromagnetism; Frequency Domain Analysis; Regression Analysis; Scattering Parameters; Jitter; Histograms; Noise; Mathematical Model; Signal Analysis; Bit Error Rate; Receivers; Design Engineering; Interference (Signal); Device Qualification; Stressed Jitter Analysis; Physical Link Characterization; Link-Path Analysis; Frequency-Domain S-Parameter; Stressed Link Path Analysis; Engineering Design; Link Path Optimization
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International Standard Serial Number (ISSN)
Article - Conference proceedings
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01 Jul 2010