An Economic-based Cyber-Security Framework for Identifying Critical Assets


This research proposes a systematic approach to identify critical assets that support the efficiency of electricity markets. NERC standards CIP provides guidance on the identification and protection of critical cyber assets that support the reliability of power systems. Those assets don't include properties that are critical to the efficiency of electricity markets. However, attacking such properties may cost electricity market customers millions of dollars. This systematic approach fills the gap, and identifies the assets that have significant impacts on the market efficiency. The methodology is to analyze congested flowgates in an electricity market. It starts from a full list of the congested flowgates, and rank the congested flowgates with Estimated Potential Benefit (EPB) calculation. Top congested flowgates are then obtained. Apply correlation calculation to the top congested flowgates. A final list of critical congested flowgates is generates as a result. The simulation is performed on an ISO market. It identifies a short list of critical congested flowgates in the ISO market. Attacking one of those critical congested flowgates may cost the ISO market averagely thousands of dollars per hour. Future study is to develop security mechanisms for the critical congested flowgates. It includes both cyber security measures and physical security measures.

Meeting Name

2014 IEEE Power and Energy Society General Meeting Conference and Exposition, PES 2014 (2014: Jul. 27-31, National Harbor, MD)


Electrical and Computer Engineering

Keywords and Phrases

Commerce; Costs; Electric Industry; Electric Power System Protection; Mobile Security; Power Markets; Congested Flowgates; Correlation Coefficient; Electricity Market; EPB; ISO; LMP; Production Cost; Shadow Price; Security of Data

International Standard Serial Number (ISSN)


Document Type

Article - Conference proceedings

Document Version


File Type





© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Jul 2014