Numerical Evaluation of Near-Field to Far-Field Transformation Robustness for EMC
Near-Field (NF) to Far-Field (FF) transformation techniques are widely used for antenna radiation problems. To perform a NF to FF or a NF to NF transformation for EMC applications, the large frequency range, and a weak signals will require data in the reactive near field. In principle, the transformation can be performed if all sources are confined in the scanned area using Huygens' Principle, which requires knowledge of the exact phase and magnitude data of measured fields. In reality, this cannot be achieved, due to uncertainties in the field probe measurements, presence of active and passive cables and limited scan areas. Thus, it is attempted to perform a transformation based on an incomplete and uncertain data set. Results of a numerical simulation tool usage for NF to FF transformation based on NF-Scanning system measured data are demonstrated.
A. Radchenko et al., "Numerical Evaluation of Near-Field to Far-Field Transformation Robustness for EMC," Proceedings of the 2012 IEEE International Symposium on Electromagnetic Compatibility (2012, Pittsburgh, PA), pp. 605-611, Institute of Electrical and Electronics Engineers (IEEE), Aug 2012.
The definitive version is available at https://doi.org/10.1109/ISEMC.2012.6351692
2012 IEEE International Symposium on Electromagnetic Compatibility (2012: Aug. 6-10, Pittsburgh, PA)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Far-field; Frequency Ranges; Huygens' Principle; Magnitude Data; Measured Field; near Fields; Near-field; Numerical Evaluations; Probe Measurements; Radiation Problems; Scan Area; Transformation Based; Transformation Techniques; Uncertain Datas; Weak Signals; Antenna Radiation; Computer Simulation; Electromagnetic Compatibility; Uncertainty Analysis; Metadata
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2012 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2012