Characterizing ESD Stress Currents in Human Wearable Devices
Currents induced on an I/O of a human wearable device IC are predicted using a test IC as a wearable device capable of transient event detection and level sensing. ESD on this pseudo wearable device using the test IC is characterized for different test scenarios and compared to the prediction.
A. Patnaik et al., "Characterizing ESD Stress Currents in Human Wearable Devices," Proceedings of the 39th Electrical Overstress/Electrostatic Discharge Symposium (2017, Tucson, AZ), Institute of Electrical and Electronics Engineers (IEEE), Sep 2017.
The definitive version is available at https://doi.org/10.23919/EOSESD.2017.8073430
39th Electrical Overstress/Electrostatic Discharge Symposium (2017: Sep. 10-14, Tucson, AZ)
Electrical and Computer Engineering
Keywords and Phrases
Electrostatic Devices; Electrostatic Discharge; Integrated Circuits; ESD Stress; Level Sensing; Test Scenario; Transient Event Detection; Wearable Devices; Wearable Technology
International Standard Book Number (ISBN)
Article - Conference proceedings
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Sep 2017