Phase-Resolved Near-Field Scan Over Random Fields
This letter discusses an averaging technique for phase-resolved scanning of the fields generated by multiple uncorrelated stochastic sources. This method can separate the field contribution of each noise source into the resulting field patterns as if the sources that are not of interest were turned off. The scanned data can be used to localize the emission sources and to calculate the far-field pattern and total radiated power.
T. Li et al., "Phase-Resolved Near-Field Scan Over Random Fields," IEEE Transactions on Electromagnetic Compatibility, vol. 58, no. 2, pp. 506-511, Institute of Electrical and Electronics Engineers (IEEE), Apr 2016.
The definitive version is available at https://doi.org/10.1109/TEMC.2016.2517651
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Condensed matter physics; Electromagnetic compatibility; Averaging technique; Emission sources; Far-field patterns; Field patterns; Near-field scan; Phase-resolved; Random fields; Total radiated power; Stochastic systems; emission source microscopy
International Standard Serial Number (ISSN)
Article - Journal
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Apr 2016