Investigation of S21 Magnitude Extraction Methodologies by using a Pattern Generator and Sampling Oscilloscope

Abstract

S-parameter measurements of a digital link path are measured with VNAs or high-end TDRs. For multi-port in-situ measurements, these become inconvenient and time consuming. However, it can be handled more conveniently in the time domain (TD) by using a pattern generator and a multichannel sampling oscilloscope, which are used for eye-diagram measurements. This paper outlines and compares three methods to extract S21 magnitude from the time domain measurements using a pattern generator and a sampling oscilloscope for any channel. The setup differs in terms of the input waveform and the processing. The comparison provides insight into the advantages and limitations of each method.

Meeting Name

2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity (2015: Mar. 15-21, Santa Clara, CA)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Center for High Performance Computing Research

Second Research Center/Lab

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Cathode ray oscilloscopes; Microprocessor chips; Scattering parameters; Multi-channel samplings; Oscilloscope; Pattern generator; S-Parameter measurements; S21; Sampling oscilloscopes; TDT; Time domain measurement; Time domain analysis

International Standard Book Number (ISBN)

978-1479919918

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

21 Mar 2015

Link to Full Text

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