Investigation of S21 Magnitude Extraction Methodologies by using a Pattern Generator and Sampling Oscilloscope
S-parameter measurements of a digital link path are measured with VNAs or high-end TDRs. For multi-port in-situ measurements, these become inconvenient and time consuming. However, it can be handled more conveniently in the time domain (TD) by using a pattern generator and a multichannel sampling oscilloscope, which are used for eye-diagram measurements. This paper outlines and compares three methods to extract S21 magnitude from the time domain measurements using a pattern generator and a sampling oscilloscope for any channel. The setup differs in terms of the input waveform and the processing. The comparison provides insight into the advantages and limitations of each method.
X. Guo et al., "Investigation of S21 Magnitude Extraction Methodologies by using a Pattern Generator and Sampling Oscilloscope," Proceedings of the 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity (2015, Santa Clara, CA), pp. 181-186, Institute of Electrical and Electronics Engineers (IEEE), Mar 2015.
The definitive version is available at https://doi.org/10.1109/EMCSI.2015.7107682
2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity (2015: Mar. 15-21, Santa Clara, CA)
Electrical and Computer Engineering
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Cathode ray oscilloscopes; Microprocessor chips; Scattering parameters; Multi-channel samplings; Oscilloscope; Pattern generator; S-Parameter measurements; S21; Sampling oscilloscopes; TDT; Time domain measurement; Time domain analysis
International Standard Book Number (ISBN)
Article - Conference proceedings
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
21 Mar 2015