A Novel De-Embedding Method Suitable for Transmission-Line Measurement
A novel de-embedding method on transmission line device under testing (DUT) is introduced in this paper. The technique can be used as an alternative to classic calibration approaches, such as SOLT, TRL, LRM, or LRRM whenever the de-embedded structure is a transmission line. The method only requires two measurement patterns: a true through as test fixture and a total pattern with targeting DUT embedded in. With a quasi-symmetry requirement in test fixtures, it is also a good substitute for newly released two-pattern de-embedding methodologies which have rigid symmetric demanding in text fixtures design and manufactures.
B. Chen et al., "A Novel De-Embedding Method Suitable for Transmission-Line Measurement," Proceedings of the Asia-Pacific International Symposium on Electromagnetic Compatibility (2015, Taipei, Taiwan), pp. 1-4, Institute of Electrical and Electronics Engineers (IEEE), May 2015.
The definitive version is available at https://doi.org/10.1109/APEMC.2015.7175313
Asia-Pacific International Symposium on Electromagnetic Compatibility (2015: May 25-29, Taipei, Taiwan)
Electrical and Computer Engineering
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Design for testability; Electromagnetic compatibility; Fixtures (tooling); Scattering parameters; De-embedding; Line reflect matches; line-reflect-reflect-match (LRRM); Mixed mode scattering parameters; Scattering parameters measurement; Short-open-load-through; Thru reflect lines; Electric lines; Transmission line
International Standard Book Number (ISBN)
Article - Conference proceedings
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 May 2015