Validating the Transmission-Line Based Material Property Extraction Procedure Including Surface Roughness for Multilayer PCBs using Simulations
Accurate frequency-dependent dielectric properties are important for accurate modeling of signal and power integrity problems. One method for extracting dielectric properties from fabricated multilayer printed circuit boards is based on the measured electrical property of fabricated transmission lines, denoted the 'Root-omega' method. In this paper, the 'Root-omega' method applied to the cases with smooth and rough conductors is validated using simulations. Potential errors in the procedure are discussed.
S. Jin et al., "Validating the Transmission-Line Based Material Property Extraction Procedure Including Surface Roughness for Multilayer PCBs using Simulations," IEEE International Symposium on Electromagnetic Compatibility (2016, Ottawa, Canada), pp. 472-477, Institute of Electrical and Electronics Engineers (IEEE), Jul 2016.
The definitive version is available at https://doi.org/10.1109/ISEMC.2016.7571694
2016 IEEE International Symposium on Electromagnetic Compatibility (2016: Jul. 25-29, Ottawa, Canada)
Electrical and Computer Engineering
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Dielectric properties; Electric lines; Electromagnetic compatibility; Multilayers; Printed circuit boards; Sensitivity analysis; Surface roughness; Accurate modeling; Frequency dependent; Multi-layer pcbs; Multilayer printed circuit board; Potential errors; Power integrity; procedure validation; Property extractions; Extraction; conductor roughness; electrical property of transmission line; material property extraction
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International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jul 2016