Characterizing EMI Radiation Physics Corresponding to Distributive Geometry Features using the PEEC Method
The reduction of electromagnetic radiation and couplings is a fundamental issue for electromagnetic compatibility (EMC) and electromagnetic interference (EMI) issues. Even though they represent distributed sources, radiation physics was seldom mapped to the geometry of the structure. In this paper, we develop a new approach based on PEEC to calculate the distributed sources for radiation and the couplings. With this approach, the radiated power from each segment as well as the transferred power between each part is evaluated. Furthermore, the physical meaning of the resultant power is interpreted. It is known that currents curved structures, bents, and other discontinuous and truncated structures cause significant radiation. The radiation from each part can be quantitatively analyzed. This method can be used to physically interpret and predict which features and structures have a small or a large impact on radiation. This provides powerful insight for diagnosing of radiation and couplings. Hence, this can be an important tool for product optimization's for EMI designs.
Y. S. Cao et al., "Characterizing EMI Radiation Physics Corresponding to Distributive Geometry Features using the PEEC Method," IEEE International Symposium on Electromagnetic Compatibility (2016, Ottawa, Canada), pp. 764 - 769, Institute of Electrical and Electronics Engineers (IEEE), Jul 2016.
The definitive version is available at https://doi.org/10.1109/ISEMC.2016.7571745
2016 IEEE International Symposium on Electromagnetic Compatibility (2016: Jul. 25-29, Ottawa, Canada)
Electrical and Computer Engineering
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Couplings; Electromagnetic pulse; Electromagnetic wave interference; Electromagnetic waves; Geometry; Heat radiation; Radiation; Signal interference; Curved structure; Distributed sources; Geometry features; New approaches; PEEC; Physical meanings; Product optimization; Radiation physics; Electromagnetic compatibility
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Article - Conference proceedings
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Jul 2016