In this study, mutual capacitance and inductance between two coupled traces is measured and computed to validate and simplify coupling algorithms used in an expert system software package. The algorithm's applicability to common microstrip configurations is tested through comparisons between FEM based solutions, |S21| measurements and the algorithm solutions under several permutations of a test board. Adjustments to the original algorithm are proposed that reduce computation times with out significantly affecting the accuracy of the result.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility (1999: Aug. 2-6, Seattle, WA)


Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

FEM Based Solutions; S21 Measurements; Capacitance; Computation Times; Coupled Traces; Electrical Engineering Computing; Electromagnetic Coupling; Electromagnetic Interference; Expert System Software Package; Expert Systems; Inductance; Mesh Generation; Microstrip Configurations; Microstrip Coupling Algorithm; Microstrip Lines; Modification; Mutual Capacitance; Software Packages; Test Board; Validation; Waveguide Theory

International Standard Book Number (ISBN)

078035057X; 9780780350571

International Standard Serial Number (ISSN)


Document Type

Article - Conference proceedings

Document Version

Final Version

File Type





© 1999 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.