Abstract
In this paper, the susceptibility of an 8-bit microcontroller to electrostatic discharge (ESD) and electrically fast transients was tested by injecting currents through a capacitive probe into the microcontroller package pins. The reaction of the microcontroller to discharges with different rise times and polarities were investigated by measuring the voltage on the tested pins and by observing the microcontroller's clock output. Susceptibility varied significantly when injecting to one pin compared to another. Interestingly, the clock was more sensitive to currents injected into I/O pins than into pins directly related to the clock (e. g. EXTAL). Further work is underway to explain the causes of susceptibility inside the IC.
Recommended Citation
L. Han et al., "Experimental Investigation of the ESD Sensitivity of an 8-Bit Microcontroller," Proceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility (2007, Honolulu, HI), Institute of Electrical and Electronics Engineers (IEEE), Jan 2007.
The definitive version is available at https://doi.org/10.1109/ISEMC.2007.173
Meeting Name
2007 IEEE International Symposium on Electromagnetic Compatibility, EMC 2007 (2007: Jul. 9-13, Honolulu, HI)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Electrostatic Discharge; Sensitivity; Microcontroller; Immunity; Testing; Electric discharges; Microcontrollers
International Standard Book Number (ISBN)
1-4244-1349-4
International Standard Serial Number (ISSN)
2158-110X
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 2007
