The embedded modulated scatterer technique (MST) is an innovative tool which can be used for microwave dielectric characterization of infrastructure and composite structures. By impinging a microwave signal on a loaded thin dipole antenna embedded in a material whose dielectric properties are sought, the resulting refelction data can be used to inversely solve for the dielectric properties of interest. Previous investigations utilized reflection information from a single loaded dipole and required known system parameters, such as radiator polarization vs. dipole alignment and relative distance between radiator and probe, to solve for the sought-for dielectric properties. This paper explores a unique application of embedded MST in which the ratio of the reflection coefficients for two independent states of a PIN diode-loaded dipole probe is utilized to significantly simplify the method for calculating dielectric properties.

Meeting Name

22nd IEEE Instrumentation and Measurement Technology Conference (2005: May 16-19, Ottawa, Ontario, Canada)


Electrical and Computer Engineering

Keywords and Phrases

Dielectric Characterization; Embedded Sensors; Modulated Scatterer Technique; Nondestructive Testing

International Standard Book Number (ISBN)


International Standard Serial Number (ISSN)


Document Type

Article - Conference proceedings

Document Version

Final Version

File Type





© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 May 2005