Parasitic inductance in printed circuit board geometries can worsen the EMI performance and signal integrity of high-speed digital designs. Partial-inductance theory is a powerful tool for analyzing inductance issues in signal integrity. However, partial inductances may not adequately model magnetic flux coupling to EMI antennas because the EMI antennas are typically open loops. Therefore, partial inductances may not always accurately predict radiated EMI from noise sources, unless used in a full-wave analysis such as PEEC. Partial inductances can be used, however, to estimate branch inductances, which can be used to predict EMI. This paper presents a method for decomposing loop or self inductances into branch inductances. Experimental as well as analytical investigations are used to compare branch- and partial-inductances.
D. M. Hockanson et al., "Considerations for Magnetic-Field Coupling Resulting in Radiated EMI," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (1998, Denver, CO), vol. 2, pp. 808-813, Institute of Electrical and Electronics Engineers (IEEE), Aug 1998.
The definitive version is available at https://doi.org/10.1109/ISEMC.1998.750310
IEEE International Symposium on Electromagnetic Compatibility (1998: Aug. 24-28, Denver, CO)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
EMI Antennas; Branch Inductances; Electromagnetic Interference; Equivalent Circuits; Inductance; Magnetic Field Coupling; Magnetic Fields; Magnetic Flux; Magnetic Flux Coupling; Parasitic Inductance; Partial Inductance Theory; Printed Circuit Board Geometries; Printed Circuits; Radiated EMI Performance; Signal Integrity; Coupling Circuits; Inductance; Magnetic Analysis; Printed Circuits; Geometry; Signal Design; Signal Analysis; Magnetic Noise
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 1998 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 1998