S-parameter circuit model extraction is usually characterized by a trade off between accuracy and complexity. Trading one feature for another may or may not affect the goodness of the reconstructed S-parameter data, which are obtained from frequency domain simulations of the models extracted. However, the ultimate test for the validity of these equivalent circuit representations should be left to eye-diagram simulations, which provide useful insights, from an SI point of view, about the degradation of the signal, as it travels through the system. Physics based simplication procedures can be used to tune the models and achieve less complexity, whereas the comparisons of the eye-diagrams may help to quantify the goodness of an these circuits extracted. In fact, the most accurate model is not necessary the best to be used.
G. Selli and M. Lai and S. Luan and J. L. Drewniak and R. E. DuBroff and J. Fan and J. L. Knighten and N. W. Smith and G. Antonini and A. Orlandi and B. Archambeault and S. R. Connor, "Validation of Equivalent Circuits Extracted from S-Parameter Data for Eye-pattern Evaluation," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2004, Santa Clara, CA), vol. 2, pp. 666-671, Institute of Electrical and Electronics Engineers (IEEE), Aug 2004.
The definitive version is available at https://doi.org/10.1109/ISEMC.2004.1349879
IEEE International Symposium on Electromagnetic Compatibility (2004: Aug. 9-13, Santa Clara, CA)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
PCB Interconnect Discontinuities; S-Parameter Data; S-Parameters; SI; Circuit Goodness; Circuit Model Extraction; Circuit Simulation; Equivalent Circuit Validation; Equivalent Circuits; Eye-Diagram Simulations; Eye-Pattern Evaluation; Physics Based Simplification; Printed Circuit Design; Accuracy; Circuit Extraction; Complexity; Eye-Diagrams; Model Order; Model Validation
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Article - Conference proceedings
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2004