A procedure is proposed for predicting TEM cell measurements from near field scans by modeling near-field scan data using equivalent sources. The first step in this procedure is to measure the tangential electric and magnetic fields over the circuit. Electric and magnetic fields are estimated from probe measurements by compensating for the characteristics of the probe. An equivalent magnetic and electric current model representing emissions is then generated from the compensated fields. These equivalent sources are used as an impressed source in an analytical formula or full wave simulation to predict measurements within the TEM cell. Experimental verification of the procedure using a microstrip trace and clock buffer show that values measured in the TEM cell and calculated from near field scan data agree within a few decibels from 1 MHz to 1 GHz.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 (2006: Aug. 14-18, Portland, OR)


Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

TEM Cell; Electromagnetic Emissions; Equivalent Source; Modeling; Near Field Measurement

International Standard Book Number (ISBN)


Document Type

Article - Conference proceedings

Document Version

Final Version

File Type





© 2006 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Aug 2006